M. Sonza Reorda

· Politecnico di Torino
44h 指数
9,591总引用
753发文
240i10

简介

AI 合成简介
[Synthesized from ORCID profile metadata] Research keywords: Test, Reliability, Fault tolerance, PE7_4 - (Micro and nano) systems engineering, automatic test equipment, collaudo, reliability analysis, circuit reliability, circuit faults, automatic test pattern generation, PE6_2 - Computer systems, parallel/distributed systems, sensor networks, embedded systems, cyber-physical systems Profiles: Scopus Author ID: 57188717230 (self); ResearcherID: J-1775-2018 (self); SciProfiles: 1135537 (self)

ℹ️ 本简介由 AI 根据教授关键词/学科资料合成, 非 ORCID 自填简介。如需准确信息, 请查阅 ORCID 官方档案或联系所属机构获取 CV。

研究方向

VLSI and Analog Circuit TestingRadiation Effects in ElectronicsIntegrated Circuits and Semiconductor Failure AnalysisSoftware Testing and Debugging TechniquesEmbedded Systems Design Techniques

Politecnico di Torino学位项目

该教授任职院校的热门项目 (PhD/Master 优先)

数据来源: OpenAlex + ORCID + Wikidata · 数据质量: verified

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